https://scholars.lib.ntu.edu.tw/handle/123456789/321873
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wang, T.-M. | en_US |
dc.contributor.author | Chang, C.-H. | en_US |
dc.contributor.author | Hwu, J.-G. | en_US |
dc.contributor.author | JENN-GWO HWU | zz |
dc.creator | Wang, T.-M.;Chang, C.-H.;Hwu, J.-G. | - |
dc.date.accessioned | 2018-09-10T05:52:20Z | - |
dc.date.available | 2018-09-10T05:52:20Z | - |
dc.date.issued | 2006 | - |
dc.identifier.uri | http://www.scopus.com/inward/record.url?eid=2-s2.0-33845659567&partnerID=MN8TOARS | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/321873 | - |
dc.language | en | en |
dc.relation.ispartof | IEEE Sensors Journal | - |
dc.source | AH | - |
dc.title | Enhancement of temperature sensitivity for metal-oxide-semiconductor (MOS) tunneling temperature sensors by utilizing hafnium oxide (HfO 2) film added on silicon dioxide (SiO 2) | - |
dc.type | journal article | en |
dc.identifier.doi | 10.1109/JSEN.2006.884424 | - |
dc.relation.pages | 1468-1472 | - |
dc.relation.journalvolume | 6 | - |
dc.relation.journalissue | 6 | - |
item.openairetype | journal article | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.orcid | 0000-0001-9688-0812 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
Appears in Collections: | 電機工程學系 |
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