https://scholars.lib.ntu.edu.tw/handle/123456789/323785
標題: | 2.2 μm axial resolution optical coherence tomography based on a 400 nm-bandwidth superluminescent diode | 作者: | Chan, M.-C. Su, Y.-S. CHING-FUH LIN CHI-KUANG SUN |
關鍵字: | Nonidentical multiple quantum well; Optical coherence tomography (OCT); Spectroscopic OCT; Superluminescent diode; Ultra-high resolution OCT | 公開日期: | 2006 | 卷: | 28 | 期: | 1 | 起(迄)頁: | 11-14 | 來源出版物: | Scanning | 摘要: | We demonstrate 2.2 μm axial resolution optical coherence tomography (OCT) in 1.1-1.7 μm wavelength regime by using a nonidentical multiple-quanum-well (MQW) superluminescent diode (SLD) with record-bandwidth emission. The compact, low-cost, and reliable light source with extreme broadband emission demonstrates significant potentials for spectroscopic and commercial OCT applications requiring ultrahigh spatial resolution. © FAMS, Inc. |
URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-32344445138&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/323785 https://www.scopus.com/inward/record.uri?eid=2-s2.0-32344445138&doi=10.1002%2fsca.4950280102&partnerID=40&md5=4176ac05a151102052034fe31ae424b1 |
ISSN: | 01610457 | SDG/關鍵字: | Bandwidth; Semiconductor diodes; Spectroscopic analysis; Tomography; Nonidentical multiple quantum well; Optical coherence tomography (OCT); Spectroscopic OCT; Superluminescent diode; Ultra-high resolution OCT; Optical properties; article; diode; image quality; imaging; light; optical coherence tomography; priority journal; spectral sensitivity; spectroscopy; Semiconductor Devices |
顯示於: | 電機工程學系 |
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