https://scholars.lib.ntu.edu.tw/handle/123456789/324102
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lin, K. | en_US |
dc.contributor.author | Zhang, H. | en_US |
dc.contributor.author | Lu, S.-S. | en_US |
dc.contributor.author | SHEY-SHI LU | zz |
dc.date.accessioned | 2018-09-10T05:58:40Z | - |
dc.date.available | 2018-09-10T05:58:40Z | - |
dc.date.issued | 2006 | - |
dc.identifier.uri | http://www.scopus.com/inward/record.url?eid=2-s2.0-33847657448&partnerID=MN8TOARS | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/324102 | - |
dc.language | en | en |
dc.relation.ispartof | International Symposium for Testing and Failure Analysis | en_US |
dc.source | AH-Scopus to ORCID | - |
dc.title | Conductive atomic force microscopy application for semiconductor failure analysis in advanced nanometer process | - |
dc.type | conference paper | en |
dc.relation.pages | 178-181 | - |
dc.relation.journalvolume | 2006 | - |
item.openairetype | conference paper | - |
item.fulltext | no fulltext | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | MediaTek-NTU Research Center | - |
crisitem.author.orcid | 0000-0003-3106-3154 | - |
crisitem.author.parentorg | Others: University-Level Research Centers | - |
顯示於: | 電機工程學系 |
在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。