https://scholars.lib.ntu.edu.tw/handle/123456789/329670
Title: | Relaxation investigation for terminals of electronic connectors under thermal shock test | Authors: | KUO-CHI LIAO | Issue Date: | 2007 | Journal Volume: | 5 | Start page/Pages: | 391-395 | Source: | ASME International Mechanical Engineering Congress and Exposition, Proceedings | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84928633660&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/329670 |
DOI: | 10.1115/IMECE200743340 |
Appears in Collections: | 生物機電工程學系 |
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