https://scholars.lib.ntu.edu.tw/handle/123456789/338187
Title: | Automatic optical inspection on TFT-LCD mura defects using background image reconstruction | Authors: | Chen, L.-C. Kuo, C.-C. PING-LANG YEN |
Issue Date: | 2008 | Journal Volume: | 364-366 I | Start page/Pages: | 400-403 | Source: | Key Engineering Materials | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-38849155743&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/338187 |
Appears in Collections: | 生物機電工程學系 |
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