https://scholars.lib.ntu.edu.tw/handle/123456789/339010
Title: | Characterizing the thickness dependence of epitaxial GaN grown over GaN nanocolumns using X-ray diffraction | Authors: | CHIH-CHUNG YANG Shiao, W.-Y. Tang, T.-Y. Chen, Y.-S. Averett, K.L. Albrecht, J.D. CHIH-CHUNG YANG |
Issue Date: | 2008 | Journal Volume: | 310 | Journal Issue: | 13 | Start page/Pages: | 3159-3162 | Source: | Journal of Crystal Growth | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-44549085826&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/339010 |
DOI: | 10.1016/j.jcrysgro.2008.04.006 |
Appears in Collections: | 電機工程學系 |
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