https://scholars.lib.ntu.edu.tw/handle/123456789/341161
Title: | A new NBTI characterization method on polycrystalline silicon thin-film transistors | Authors: | CHEE-WEE LIU Sun, H.-C. Huang, C.-F. Chen, Y.-T. Liu, C.W. Hsu, Y.-C. Shih, C.-C. Chen, J.-S. CHEE-WEE LIU |
Issue Date: | 2008 | Journal Volume: | 2 | Start page/Pages: | 659-662 | Source: | IDW '08 - 15th International Display Workshops | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-77954100055&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/341161 |
Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.