https://scholars.lib.ntu.edu.tw/handle/123456789/342611
Title: | QBIST: 1-Testable Quantum Built-In Self-Test for any Boolean Circuit | Authors: | Y. H. Chou I. M. Tsai S. Y. Kuo SY-YEN KUO |
Issue Date: | Apr-2008 | Start page/Pages: | 261-266 | Source: | 26th IEEE VLSI Test Symposium (VTS'08) | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/342611 | DOI: | 10.1109/VTS.2008.49 |
Appears in Collections: | 電機工程學系 |
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