https://scholars.lib.ntu.edu.tw/handle/123456789/347299
Title: | Applications of damage models to durability investigations for electronic connectors | Authors: | KUO-CHI LIAO Chang, C.-C. |
Issue Date: | 2009 | Journal Volume: | 30 | Journal Issue: | 1 | Start page/Pages: | 194-199 | Source: | Materials and Design | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-48549100418&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/347299 |
DOI: | 10.1016/j.matdes.2008.04.047 |
Appears in Collections: | 生物機電工程學系 |
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