https://scholars.lib.ntu.edu.tw/handle/123456789/348155
標題: | Cell-based interconnection network design and the all-pairs examination problem | 作者: | JA-LING WU | 公開日期: | 1989 | 卷: | 67 | 期: | 4 | 起(迄)頁: | 503-512 | 來源出版物: | International Journal of Electronics | 摘要: | A systematic procedure for the design of VLSI cell-based interconnection networks is proposed through the concept of the all-pairs examination problem. Since there are no line intersections between the intermodular interconnections of the proposed network, it is very suitable for planar VLSI implementation. © 1989 Taylor & Francis Ltd. |
URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0024746155&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/348155 |
DOI: | 10.1080/00207218908921104 | SDG/關鍵字: | All-Pairs Examination Problem; Cell-Based Interconnection Network Design; Merging Process; Planar VLSI; Switching Functions; Integrated Circuits, VLSI; article; electronics |
顯示於: | 資訊工程學系 |
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