https://scholars.lib.ntu.edu.tw/handle/123456789/352492
Title: | Power Scan: DFT for Power Switches in VLSI Designs | Authors: | B. C. Bai CHIEN-MO LI |
Issue Date: | Jan-2009 | Source: | International Test Conference | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/352492 |
Appears in Collections: | 電子工程學研究所 |
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