https://scholars.lib.ntu.edu.tw/handle/123456789/366761
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | X.-L. Huang | en_US |
dc.contributor.author | J.-L. Huang | en_US |
dc.contributor.author | JIUN-LANG HUANG | zz |
dc.creator | X.-L. Huang;J.-L. Huang | - |
dc.date.accessioned | 2018-09-10T08:47:21Z | - |
dc.date.available | 2018-09-10T08:47:21Z | - |
dc.date.issued | 2011-10 | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/366761 | - |
dc.language | en | en |
dc.relation.ispartof | IEEE Transactions on Very Large Scale Integration | - |
dc.source | AH-anncc | - |
dc.title | ADC/DAC Loopback Linearity Testing by DAC Output Offsetting and Scaling | - |
dc.type | journal article | en |
dc.identifier.doi | 10.1109/TVLSI.2010.2063443 | - |
dc.identifier.scopus | 2-s2.0-80051800524 | - |
dc.identifier.isi | WOS:000293755900004 | - |
dc.relation.pages | 1765-1774 | - |
dc.relation.journalvolume | 19 | - |
dc.relation.journalissue | 10 | - |
item.cerifentitytype | Publications | - |
item.fulltext | no fulltext | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.openairetype | journal article | - |
item.grantfulltext | none | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Program in Integrated Circuit Design and Automation | - |
crisitem.author.orcid | 0000-0002-9425-3855 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Graduate School of Advanced Technology | - |
顯示於: | 電子工程學研究所 |
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