https://scholars.lib.ntu.edu.tw/handle/123456789/374354
Title: | 3D IC test scheduling using simulated annealing | Authors: | CHIEN-MO LI CY Hsu CY Kuo JCM Li K. Chakrbarty CHIEN-MO LI |
Issue Date: | Jan-2012 | Source: | IEEE VLSI-DAT | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/374354 | DOI: | 10.1109/vlsi-dat.2012.6212659 |
Appears in Collections: | 電子工程學研究所 |
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