https://scholars.lib.ntu.edu.tw/handle/123456789/380225
Title: | Modeling and optimization of edge dislocation stressors | Authors: | Tsai, M.-H. Jan, S.-R. Yeh, C.-Y. Liu, C.W. Goldstein, R.V. Gorodtsov, V.A. Shushpannikov, P.S. CHEE-WEE LIU |
Issue Date: | 2013 | Journal Volume: | 34 | Journal Issue: | 8 | Start page/Pages: | 948-950 | Source: | IEEE Electron Device Letters | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84881026346&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/380225 |
DOI: | 10.1109/LED.2013.2266124 |
Appears in Collections: | 電機工程學系 |
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