https://scholars.lib.ntu.edu.tw/handle/123456789/380226
Title: | Mobility strain response and low temperature characterization of Ge p-MOSFETs | Authors: | CHEE-WEE LIU Wong, I.-H. Chen, Y.-T. Ciou, H.-J. Chen, Y.-S. Yan, J.-Y. CHEE-WEE LIU |
Issue Date: | 2013 | Start page/Pages: | 73-74 | Source: | Device Research Conference, DRC | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84890058060&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/380226 |
DOI: | 10.1109/DRC.2013.6633799 |
Appears in Collections: | 電機工程學系 |
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