https://scholars.lib.ntu.edu.tw/handle/123456789/381718
Title: | Test Generation of Path Delay Faults Induced by Defects in Power TSV | Authors: | CHIEN-MO LI Chi-Jih Shih Shih-An Hsieh Yi-Chang Lu James Chien-Mo Li Tzong-Lin Wu K. Chakrabarty CHIEN-MO LI |
Issue Date: | Jan-2013 | Source: | IEEE Asian Test Symposium | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/381718 | DOI: | 10.1109/ATS.2013.18 |
Appears in Collections: | 電子工程學研究所 |
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