https://scholars.lib.ntu.edu.tw/handle/123456789/392012
Title: | Wafer map failure pattern recognition and similarity ranking for large-scale data sets | Authors: | Wu, M.-J. Jang, J.-S.R. Chen, J.-L. JYH-SHING JANG |
Issue Date: | 2015 | Journal Volume: | 28 | Journal Issue: | 1 | Start page/Pages: | 1-12 | Source: | IEEE Transactions on Semiconductor Manufacturing | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84922505720&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/392012 |
DOI: | 10.1109/TSM.2014.2364237 |
Appears in Collections: | 資訊工程學系 |
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