https://scholars.lib.ntu.edu.tw/handle/123456789/394735
Title: | A Test-Application-Count Based Learning Technique for Test Time Reduction | Authors: | G.-Y. Lin K.-H. Tsai J.-L. Huang W.-T. Cheng JIUN-LANG HUANG |
Issue Date: | Jan-2015 | Source: | International Symposium on VLSI Design, Automation, and Test | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/394735 | DOI: | 10.1109/VLSI-DAT.2015.7114507 |
Appears in Collections: | 電子工程學研究所 |
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