https://scholars.lib.ntu.edu.tw/handle/123456789/404506
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Liu, C. | en_US |
dc.contributor.author | Chen, P.-G. | en_US |
dc.contributor.author | Xie, M.-J. | en_US |
dc.contributor.author | Liu, S.-N. | en_US |
dc.contributor.author | Lee, J.-W. | en_US |
dc.contributor.author | Huang, S.-J. | en_US |
dc.contributor.author | Liu, S. | en_US |
dc.contributor.author | Chen, Y.-S. | en_US |
dc.contributor.author | Lee, H.-Y. | en_US |
dc.contributor.author | Liao, M.-H. | en_US |
dc.contributor.author | Chen, P.-S. | en_US |
dc.contributor.author | Lee, M.-H. | en_US |
dc.creator | Lee, M.-H.;Chen, P.-S.;Lee, H.-Y.;Chen, Y.-S.;Liu, S.;Huang, S.-J.;Lee, J.-W.;Liu, S.-N.;Xie, M.-J.;Chen, P.-G.;Liu, C.;Liao, M.-H. | - |
dc.date.accessioned | 2019-03-11T08:01:12Z | - |
dc.date.available | 2019-03-11T08:01:12Z | - |
dc.date.issued | 2016 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/404506 | - |
dc.relation.ispartof | Japanese Journal of Applied Physics | en_US |
dc.title | Simulation-based study of negative-capacitance double-gate tunnel field-effect transistor with ferroelectric gate stack | en_US |
dc.type | journal article | en |
dc.identifier.doi | 10.7567/JJAP.55.04EB08 | - |
dc.identifier.scopus | 2-s2.0-84963680032 | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
dc.relation.pages | 492-508 | - |
dc.relation.journalvolume | 55 | - |
dc.relation.journalissue | 4 | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
item.openairetype | journal article | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.cerifentitytype | Publications | - |
crisitem.author.orcid | 0000-0003-2942-4520 | - |
顯示於: | 電機工程學系 |
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