https://scholars.lib.ntu.edu.tw/handle/123456789/415000
標題: | Life distribution and reliability analysis of high-power light emitting diodes under thermal environments | 作者: | Hsu Y. Wu W.-F. Zou C.-C. |
公開日期: | 2014 | 出版社: | International Society of Science and Applied Technologies | 起(迄)頁: | 136-140 | 來源出版物: | 20th ISSAT International Conference Reliability and Quality in Design | URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84908311940&partnerID=40&md5=d0904ae6ab6419e51645c914b41844dd https://scholars.lib.ntu.edu.tw/handle/123456789/415000 |
ISBN: | 9780991057603 |
顯示於: | 機械工程學系 |
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