https://scholars.lib.ntu.edu.tw/handle/123456789/438588
Title: | Relaxation investigation for terminals of electronic connectors under thermal shock test | Authors: | KUO-CHI LIAO Lin K.-H. |
Issue Date: | 2008 | Journal Volume: | 5 | Start page/Pages: | 391-395 | Source: | ASME International Mechanical Engineering Congress and Exposition, Proceedings | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/438588 | ISBN: | 0791842991; 9780791842997 | DOI: | 10.1115/IMECE2007-43340 |
Appears in Collections: | 生物機電工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.