https://scholars.lib.ntu.edu.tw/handle/123456789/443320
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wu, S.Y. | en_US |
dc.contributor.author | Chen, K.H. | en_US |
dc.contributor.author | Lin, Y.H. | en_US |
dc.contributor.author | Cheng, C.K. | en_US |
dc.contributor.author | Hsu, C.H. | en_US |
dc.contributor.author | Kwo, J. | en_US |
dc.contributor.author | MINGHWEI HONG | en_US |
dc.date.accessioned | 2019-12-27T07:49:18Z | - |
dc.date.available | 2019-12-27T07:49:18Z | - |
dc.date.issued | 2015 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/443320 | - |
dc.relation.ispartof | Microelectronic Engineering | - |
dc.title | Single-crystal atomic layer deposited Y<inf>2</inf>O<inf>3</inf> on GaAs(0 0 1) - Growth, structural, and electrical characterization | - |
dc.type | journal article | en |
dc.identifier.doi | 10.1016/j.mee.2015.04.061 | - |
dc.identifier.scopus | 2-s2.0-84929167786 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84929167786&doi=10.1016%2fj.mee.2015.04.061&partnerID=40&md5=1e23a693bb1f68959599170061103088 | - |
dc.relation.pages | 310-313 | - |
dc.relation.journalvolume | 147 | - |
item.openairetype | journal article | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | Applied Physics | - |
crisitem.author.dept | Center for Condensed Matter Sciences | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | Physics | - |
crisitem.author.orcid | 0000-0003-4657-0933 | - |
crisitem.author.parentorg | College of Science | - |
crisitem.author.parentorg | Others: University-Level Research Centers | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Science | - |
Appears in Collections: | 物理學系 |
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