https://scholars.lib.ntu.edu.tw/handle/123456789/447950
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Liao, M.-H. | en_US |
dc.contributor.author | Hsieh, C.-P. | en_US |
dc.contributor.author | Lee, C.-C. | en_US |
dc.contributor.author | MING-HAN LIAO | zz |
dc.creator | MING-HAN LIAO;Lee, C.-C.;Hsieh, C.-P.;Liao, M.-H. | - |
dc.date.accessioned | 2020-01-13T08:22:34Z | - |
dc.date.available | 2020-01-13T08:22:34Z | - |
dc.date.issued | 2017 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/447950 | - |
dc.relation.ispartof | AIP Advances | - |
dc.title | The investigation of self-heating effect on Si<inf>1-x</inf>Ge<inf>x</inf> FinFETs with different device structures, Ge concentration, and operated voltages | en_US |
dc.type | journal article | - |
dc.identifier.doi | 10.1063/1.4983401 | - |
dc.identifier.scopus | 2-s2.0-85019248090 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85019248090&doi=10.1063%2f1.4983401&partnerID=40&md5=9c4bbee3e6c46ea90f6680a06ff04505 | - |
dc.relation.journalvolume | 7 | - |
dc.relation.journalissue | 5 | - |
item.grantfulltext | none | - |
item.fulltext | no fulltext | - |
item.openairetype | journal article | - |
item.cerifentitytype | Publications | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
crisitem.author.orcid | 0000-0003-2942-4520 | - |
Appears in Collections: | 機械工程學系 |
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