https://scholars.lib.ntu.edu.tw/handle/123456789/447954| Title: | Ge<inf>1 - X</inf>Si<inf>x</inf> on Ge-based n-type metal-oxide semiconductor field-effect transistors by device simulation combined with high-order stress-piezoresistive relationships | Authors: | Lee, C.-C. Hsieh, C.-P. Huang, P.-C. Cheng, S.-W. Liao, M.-H. MING-HAN LIAO |
Issue Date: | 2016 | Journal Volume: | 602 | Start page/Pages: | 78-83 | Source: | Thin Solid Films | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/447954 | DOI: | 10.1016/j.tsf.2015.08.051 |
| Appears in Collections: | 機械工程學系 |
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