https://scholars.lib.ntu.edu.tw/handle/123456789/447979
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chang, S.-T. | en_US |
dc.contributor.author | Liao, M.-H. | en_US |
dc.contributor.author | Lee, C.-C. | en_US |
dc.contributor.author | Huang, J. | en_US |
dc.contributor.author | Wang, W.-C. | en_US |
dc.contributor.author | MING-HAN LIAO | en_US |
dc.creator | MING-HAN LIAO;Hsieh, B.-F.;Wang, W.-C.;Huang, J.;Lee, C.-C.;Liao, M.-H.;Chang, S.-T. | - |
dc.date.accessioned | 2020-01-13T08:22:40Z | - |
dc.date.available | 2020-01-13T08:22:40Z | - |
dc.date.issued | 2009 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/447979 | - |
dc.relation.ispartof | Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics | - |
dc.title | Carrier backscattering characteristics of nanoscale strained complementary metal-oxide-semiconductor devices featuring the optimal stress engineering | en_US |
dc.type | conference paper | en |
dc.identifier.doi | 10.1116/1.3125275 | - |
dc.identifier.scopus | 2-s2.0-79953894474 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-79953894474&doi=10.1116%2f1.3125275&partnerID=40&md5=a3cb7e19505671225ca2bf858a73cf32 | - |
dc.relation.pages | 1261-1266 | - |
dc.relation.journalvolume | 27 | - |
dc.relation.journalissue | 3 | - |
item.fulltext | no fulltext | - |
item.cerifentitytype | Publications | - |
item.openairetype | conference paper | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.grantfulltext | none | - |
crisitem.author.orcid | 0000-0003-2942-4520 | - |
顯示於: | 機械工程學系 |
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