https://scholars.lib.ntu.edu.tw/handle/123456789/488000
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lin, Chih-Jen | en_US |
dc.contributor.author | Zorian, Yervant | en_US |
dc.contributor.author | Bhawmik, Sudipta | en_US |
dc.contributor.author | CHIH-JEN LIN | zz |
dc.creator | Lin, Chih-Jen;Zorian, Yervant;Bhawmik, Sudipta | - |
dc.date.accessioned | 2020-05-04T07:48:14Z | - |
dc.date.available | 2020-05-04T07:48:14Z | - |
dc.date.issued | 1995 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/488000 | - |
dc.relation.ispartof | J. Electronic Testing | - |
dc.title | Integration of partial scan and built-in self-test. | en_US |
dc.type | journal article | en |
dc.identifier.doi | 10.1007/BF00993320 | - |
dc.identifier.url | https://doi.org/10.1007/BF00993320 | - |
dc.relation.pages | 125-137 | - |
dc.relation.journalvolume | 7 | - |
dc.relation.journalissue | 1-2 | - |
item.fulltext | no fulltext | - |
item.cerifentitytype | Publications | - |
item.openairetype | journal article | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.grantfulltext | none | - |
crisitem.author.dept | Networking and Multimedia | - |
crisitem.author.dept | Computer Science and Information Engineering | - |
crisitem.author.dept | Industrial Engineering | - |
crisitem.author.dept | Center for Artificial Intelligence and Advanced Robotics | - |
crisitem.author.orcid | 0000-0003-4684-8747 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Engineering | - |
crisitem.author.parentorg | Others: University-Level Research Centers | - |
Appears in Collections: | 資訊工程學系 |
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