https://scholars.lib.ntu.edu.tw/handle/123456789/488002| Title: | PSBIST: A Partial-Scan Based Built-In Self-Test Scheme. | Authors: | Lin, Chih-Jen Zorian, Yervant Bhawmik, Sudipta CHIH-JEN LIN |
Issue Date: | 1993 | Start page/Pages: | 507-516 | Source: | Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993 | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/488002 | DOI: | 10.1109/TEST.1993.470660 |
| Appears in Collections: | 資訊工程學系 |
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