https://scholars.lib.ntu.edu.tw/handle/123456789/491657
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Saijo, H. | en_US |
dc.contributor.author | Nakagawa, M. | en_US |
dc.contributor.author | Yamada, M. | en_US |
dc.contributor.author | Hsu, J.-T. | en_US |
dc.contributor.author | TU, R.-C. | en_US |
dc.contributor.author | Yang, J.-R. | en_US |
dc.contributor.author | Shiojiri, M. | en_US |
dc.contributor.author | JER-REN YANG | en_US |
dc.creator | JER-REN YANG;Shiojiri, M.;Yang, J.-R.;TU, R.-C.;Hsu, J.-T.;Yamada, M.;Nakagawa, M.;Saijo, H. | - |
dc.date.accessioned | 2020-05-12T02:51:27Z | - |
dc.date.available | 2020-05-12T02:51:27Z | - |
dc.date.issued | 2004 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/491657 | - |
dc.relation.ispartof | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | - |
dc.title | High-resolution scanning electron microscopy observation of GaN/AlGaN strained-layer superstructures in GaN-based violet laser diodes | en_US |
dc.type | journal article | en |
dc.identifier.doi | 10.1143/JJAP.43.968 | - |
dc.identifier.scopus | 2-s2.0-2442478767 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-2442478767&doi=10.1143%2fJJAP.43.968&partnerID=40&md5=0b2b4d6ec6eb8cadb6563dfd249334db | - |
dc.relation.pages | 968-969 | - |
dc.relation.journalvolume | 43 | - |
dc.relation.journalissue | 3 | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.fulltext | no fulltext | - |
item.openairetype | journal article | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | Materials Science and Engineering | - |
crisitem.author.orcid | 0000-0001-7897-7039 | - |
crisitem.author.parentorg | College of Engineering | - |
Appears in Collections: | 材料科學與工程學系 |
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