https://scholars.lib.ntu.edu.tw/handle/123456789/491945
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Kuo, B.-H. | en_US |
dc.contributor.author | Tsai, D.-C. | en_US |
dc.contributor.author | Huang, Y.-L. | en_US |
dc.contributor.author | Hsu, P.-C. | en_US |
dc.contributor.author | Chuang, T.-H. | en_US |
dc.contributor.author | Lee, J.-D. | en_US |
dc.contributor.author | Tsai, H.-H. | en_US |
dc.contributor.author | Shieu, F.-S. | en_US |
dc.contributor.author | TUNG-HAN CHUANG | en_US |
dc.creator | TUNG-HAN CHUANG;Shieu, F.-S.;Tsai, H.-H.;Lee, J.-D.;Chuang, T.-H.;Hsu, P.-C.;Huang, Y.-L.;Tsai, D.-C.;Kuo, B.-H. | - |
dc.date.accessioned | 2020-05-12T02:53:01Z | - |
dc.date.available | 2020-05-12T02:53:01Z | - |
dc.date.issued | 2019 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/491945 | - |
dc.relation.ispartof | Journal of Materials Science: Materials in Electronics | - |
dc.title | Au-induced improvements in the grain stability and mechanical properties of Ag-based alloy wires under electrical current stressing | en_US |
dc.type | journal article | en |
dc.identifier.doi | 10.1007/s10854-019-01936-3 | - |
dc.identifier.scopus | 2-s2.0-85070883786 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85070883786&doi=10.1007%2fs10854-019-01936-3&partnerID=40&md5=b4c434dc93a0d5d037051da698908ef5 | - |
dc.relation.pages | 15897-15911 | - |
dc.relation.journalvolume | 30 | - |
dc.relation.journalissue | 17 | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.openairetype | journal article | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
item.fulltext | no fulltext | - |
顯示於: | 材料科學與工程學系 |
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