https://scholars.lib.ntu.edu.tw/handle/123456789/503331
Title: | The mechanism of the recrystallization process in epitaxial GaN under dynamic stress field: Atomistic origin of planar defect formation | Authors: | Das, C.R. Dhara, S. Hsu, H.C. Chen, L.C. Jeng, Y.R. Bhaduri, A.K. Raj, B. Chen, K.H. Albert, S.K. |
Issue Date: | 2009 | Publisher: | John Wiley & Sons, Inc. | Journal Volume: | 40 | Journal Issue: | 12 | Start page/Pages: | 1881-1884 | Source: | Journal of Raman Spectroscopy | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/503331 | ISSN: | 03770486 | DOI: | 10.1002/jrs.2336 |
Appears in Collections: | 凝態科學研究中心 |
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