https://scholars.lib.ntu.edu.tw/handle/123456789/547486| Title: | Absolute depth measurement using multiphase normalized cross-correlation for precise optical profilometry | Authors: | Duong, D.-H. Chen, C.-S. Chen, L.-C. LIANG-CHIA CHEN |
Issue Date: | 2019 | Journal Volume: | 19 | Journal Issue: | 21 | Source: | Sensors (Switzerland) | URI: | https://www.scopus.com/inward/record.url?eid=2-s2.0-85074272659&partnerID=40&md5=949e52a4ca4a0e3cfd6c7930ba746098 https://scholars.lib.ntu.edu.tw/handle/123456789/547486 |
ISSN: | Duong, D.-H.;Chen, C.-S.;Chen, L.-C. | DOI: | 10.3390/s19214683 |
| Appears in Collections: | 機械工程學系 |
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