https://scholars.lib.ntu.edu.tw/handle/123456789/576232
標題: | Scratch-induced crack propagation on C-plane sapphire | 作者: | Wang N Jiang F Hu Z Liao Y.-S. YUNN-SHIUAN LIAO |
關鍵字: | Morphology; Piles; Sapphire; Scanning electron microscopy; Surface morphology; C-plane sapphire; Constant loads; Crack initiation and propagation; Fracture mechanisms; Low load; Optical profiler; Rockwell indenter; Sapphire substrates; Cracks | 公開日期: | 2017 | 起(迄)頁: | 1166-1171 | 來源出版物: | ISAAT 2017 - Proceedings of the 20th International Symposium on Advances in Abrasive Technology | 摘要: | The constant load scratching experiment were carried out on the C-plane sapphire with Rockwell indenter to investigate crack initiation and propagation. The surface morphology of sapphire substrate was detected by scanning electron microscopy (SEM). The depths of scratches and pile-up of sapphire material were measured by a 3D optical profiler. The fracture mechanism of sapphire was analyzed. The experimental results showed that the Hertz trailing cracks were observed in the center of the groove at low load. The surface morphology is almost symmetrical when _ _ scratching along (1100) and (0110) direction. But it is asymmetric when scratching along (1210) and _ _ _ (1120) direction. And the phenomenon of slip can be observed evidently. The anisotropic scratching patterns were closely related to the activated slip/twinning systems. ? ISAAT 2017.All right reserved. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85094139961&partnerID=40&md5=a265c3d3bdd0e413f446d2d2a9e1223f https://scholars.lib.ntu.edu.tw/handle/123456789/576232 |
顯示於: | 機械工程學系 |
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