https://scholars.lib.ntu.edu.tw/handle/123456789/590728| Title: | Applications of positron annihilation, photoluminescence, and Raman spectroscopies to analyze the defect near the Si0.5Ge0.5/Si interface with super quality by diluted HF treatment | Authors: | C.-H. Chen M.-H. Liao K.-R. Lee W.-S. Hong K.-S. Liao M.-C. Hung W.-S. Wang MING-HAN LIAO |
Issue Date: | 2012 | Source: | 第十六屆非破壞檢測技術研討會暨年會論文競賽 | Description: | Taipei |
URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/590728 |
| Appears in Collections: | 機械工程學系 |
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