https://scholars.lib.ntu.edu.tw/handle/123456789/607221
標題: | Lifetime elongation of quantum-dot light-emitting diodes by inhibiting the degradation of hole transport layer | 作者: | Lin B.-Y Ding W.-C Chen C.-H Kuo Y.-P Lee C.-Y Chiu T.-L. JIUN-HAW LEE |
關鍵字: | Degradation;Display devices;Efficiency;Electroluminescence;Elongation;Light;Nanocrystals;Photoluminescence;Quantum chemistry;Semiconductor quantum dots;Colloidal quantum dots;Efficiency improvement;Fundamental experiments;Hole transporting layers;Light emitting devices;Poly(9-vinylcarbazole);Quantum-dot light emitting diodes;Transient electroluminescence;Organic light emitting diodes (OLED) | 公開日期: | 2021 | 卷: | 11 | 期: | 34 | 起(迄)頁: | 20884-20891 | 來源出版物: | RSC Advances | 摘要: | Developing a colloidal quantum-dot light-emitting device (QDLED) with high efficiency and good reliability is necessarily preliminary for the next-generation high-quality display application. Most QDLED reports are focused on efficiency improvement, but the device operational lifetime issue is less addressed and also the relevant degradation mechanisms. This study achieved a 1.72 times elongation in the operational lifetime and a 9 times improvement in the efficiency of QDLED by inserting a hole-transporting/electron-blocking poly(9-vinylcarbazole) (PVK) layer, which prevented operational degradation on poly[(9,9-dioctylfluorenyl-2,7-diyl)-co-(4,4′-(N-(4-secbutylphenyl))-diphenylamine)] (TFB) hole-transporting layer and also confined the electron in the QD-emitting layer. Although the TFB/PVK HTL structure is a well-known pair to enhance the device performance, its detailed mechanisms were rarely mentioned, especially for relative operational lifetime issues. Herein, a new insight behind operational lifetime elongation of QDLED is disclosed through various fundamental experiments including steady-state photoluminescence, transient electroluminescence and single-carrier only devices. Evidently, other than QD degradation, this study found that the other crucial factor that decreased the device lifetime was TFB-HTL degradation using steady-state photoluminescence and transient electroluminescence analyses. The PVK electron-only device exhibited a stable voltage value when it was driven by fixed current, which also affirmed that PVK has excellent electron-stability characteristics. ? The Royal Society of Chemistry 2021. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85108560532&doi=10.1039%2fd1ra03310g&partnerID=40&md5=067f06b0d2eb8d4db79f245a22ef848a https://scholars.lib.ntu.edu.tw/handle/123456789/607221 |
ISSN: | 20462069 | DOI: | 10.1039/d1ra03310g |
顯示於: | 電機工程學系 |
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