https://scholars.lib.ntu.edu.tw/handle/123456789/612015
標題: | The development of contouring testing devices for CNC machine tools | 作者: | Jywe W. Lin C.-C. Shyu L.-H. Lin B.-J. Wen-Yuh Jywe |
關鍵字: | Least squares approximations;Machine tools;Optical sensors;Quality control;Semiconductor lasers;Quadrant sensor contouring system (QSCS);Contour measurement | 公開日期: | 2002 | 卷: | 23 | 期: | 2 | 起(迄)頁: | 143-153 | 來源出版物: | Journal of the Chinese Society of Mechanical Engineers, Transactions of the Chinese Institute of Engineers, Series C/Chung-Kuo Chi Hsueh Kung Ch'eng Hsuebo Pao | 摘要: | Various testing devices for specified contouring testing purposes on a CNC machine tool were developed in this paper. For checking the dynamic performance of a CNC machine tool, a small-radius contouring device was employed. This device was composed of a laser diode and a quadrant sensor. For checking geometry error of a CNC machine tool, a long-radius contouring device was employed. An optical scale contouring system with designed linkage was developed Furthermore, the application of this optical scale linkage to test the volumetric error of a CNC machine tool was represented. Also, a 2D optical encoder contouring system was introduced to test the performance of a CNC machine tool under various NC paths. Finally, for checking the contouring performance of a CNC machine tool under actual cutting conditions, a non-contact in-processing measurement device was described. Experimental work was carried out and represented in the paper. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0036544326&partnerID=40&md5=e558a306a1645bb45195818874f205bd https://scholars.lib.ntu.edu.tw/handle/123456789/612015 |
顯示於: | 機械工程學系 |
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