https://scholars.lib.ntu.edu.tw/handle/123456789/614659
標題: | Temperature dependence of elastic and plastic deformation behavior of a refractory high-entropy alloy | 作者: | Lee C.; Chou Y.-C. YI-CHIA CHOU |
關鍵字: | Calculations; Edge dislocations; Elastic moduli; Entropy; High resolution transmission electron microscopy; High-entropy alloys; Neutron diffraction; Plastic deformation; Scanning electron microscopy; Single crystals; Temperature distribution; Anisotropic deformation; Elastic and plastic deformation; First-principles calculation; High-angle annular dark fields; In-situ neutron diffraction; Plastic deformation behavior; Resonant Ultrasound Spectroscopy; Theoretical calculations; Refractory alloys | 公開日期: | 2020 | 出版社: | American Association for the Advancement of Science | 卷: | 6 | 期: | 37 | 來源出版物: | Science Advances | 摘要: | Single-phase solid-solution refractory high-entropy alloys (HEAs) show remarkable mechanical properties, such as their high yield strength and substantial softening resistance at elevated temperatures. Hence, the in-depth study of the deformation behavior for body-centered cubic (BCC) refractory HEAs is a critical issue to explore the uncovered/unique deformation mechanisms. We have investigated the elastic and plastic deformation behaviors of a single BCC NbTaTiV refractory HEA at elevated temperatures using integrated experimental efforts and theoretical calculations. The in situ neutron diffraction results reveal a temperature-dependent elastic anisotropic deformation behavior. The single-crystal elastic moduli and macroscopic Young’s, shear, and bulk moduli were determined from the in situ neutron diffraction, showing great agreement with first-principles calculations, machine learning, and resonant ultrasound spectroscopy results. Furthermore, the edge dislocation–dominant plastic deformation behaviors, which are different from conventional BCC alloys, were quantitatively described by the Williamson-Hall plot profile modeling and high-angle annular dark-field scanning transmission electron microscopy. © 2020 The Authors, some rights reserved. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85090884611&doi=10.1126%2fsciadv.aaz4748&partnerID=40&md5=f078b097f281fd4871daadf988d97438 https://scholars.lib.ntu.edu.tw/handle/123456789/614659 |
ISSN: | 23752548 | DOI: | 10.1126/sciadv.aaz4748 |
顯示於: | 材料科學與工程學系 |
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