https://scholars.lib.ntu.edu.tw/handle/123456789/614668
標題: | Nanowire growth kinetics in aberration corrected environmental transmission electron microscopy | 作者: | Chou Y.-C.; Panciera F.; Reuter M.C.; Stach E.A.; Ross F.M. YI-CHIA CHOU |
關鍵字: | nanowire; silicon; Article; catalyst; chemical reaction; environmental transmission electron microscopy; flow kinetics; growth kinetics; high temperature; intermethod comparison; kinetics; microscopy; reaction analysis; scanning electron microscopy; transmission electron microscopy; ultra high vacuum microscopy; water vapor | 公開日期: | 2016 | 出版社: | Royal Society of Chemistry | 卷: | 52 | 期: | 33 | 起(迄)頁: | 5686-5689 | 來源出版物: | Chemical Communications | 摘要: | We visualize atomic level dynamics during Si nanowire growth using aberration corrected environmental transmission electron microscopy, and compare with lower pressure results from ultra-high vacuum microscopy. We discuss the importance of higher pressure observations for understanding growth mechanisms and describe protocols to minimize effects of the higher pressure background gas. © The Royal Society of Chemistry 2016. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84966319183&doi=10.1039%2fc6cc00303f&partnerID=40&md5=052ee16df7b50e641211030bc17fad08 https://scholars.lib.ntu.edu.tw/handle/123456789/614668 |
ISSN: | 13597345 | 其他識別: | CHCOF | DOI: | 10.1039/c6cc00303f |
顯示於: | 材料科學與工程學系 |
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