https://scholars.lib.ntu.edu.tw/handle/123456789/616476
標題: | A structural and calorimetric study of the transformations in sputtered Al-Mn and Al-Mn-Si films | 作者: | Chen L.C. Spaepen F. Robertson J.L. Moss S.C. Hiraga K. LI-CHYONG CHEN |
公開日期: | 1990 | 卷: | 5 | 期: | 9 | 起(迄)頁: | 1871-1879 | 來源出版物: | Journal of Materials Research | 摘要: | Scanning and isothermal calorimetry, together with x-ray diffraction and high resolution transmission electron microscopy (TEM), have been used to characterize Al-Mn and Al-Mn-Si films sputtered onto substrates at 60 °C, 45 °C, and −100 °C. In the case of Al0.83Mn0.17; the monotonically decreasing isothermal calorimetric signal, characteristic of a grain growth process, has proved decisive in identifying the as-sputtered “amorphous” state as microquasicrystalline, with an average grain size of ∼20 Å, in agreement with an estimate of correlation range from the x-ray pattern. The TEM at 400 keV reveals well-defined atomic or lattice images in annealed films but only barely resolved grains (ordered clusters) in the as-sputtered films. The relation between the metallic glass and the microquasicrystalline state in these alloys is discussed. © 1990, Materials Research Society. All rights reserved. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0025494448&doi=10.1557%2fJMR.1990.1871&partnerID=40&md5=2b5a597fe74b8f6d995fea1bb3b0a56b https://scholars.lib.ntu.edu.tw/handle/123456789/616476 |
ISSN: | 08842914 | DOI: | 10.1557/JMR.1990.1871 | SDG/關鍵字: | Aluminum Manganese Silicon Alloys - Crystallization;Aluminum Metallography - Transformations;Calorimetry;Films - X-Ray Analysis;Glass, Metallic - Sputtering;Film Sputtering;Isothermal Calorimetry;Microquasicrystalline State;Aluminum Manganese Alloys |
顯示於: | 凝態科學研究中心 |
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