Browsing by Author "Cheng, J.-Y. and Hwu, J.-G."
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Publication Characterization of edge fringing effect on the C-V responses from depletion to deep depletion of MOS(p) capacitors with ultrathin oxide and high-κ dielectric(2012); Cheng, J.-Y. and Hwu, J.-G.journal articleScopus© Citations 28