公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2008 | Diagnosis of Multiple Scan Chain Timing Fault | Chuang, W.S.; Li, James C.-M. | IEEE Trans. Computer-aided Design of IC and Syst | |||
2006 | Logic and Fault Simulation | Huang, J.-L.; Li, James C.-M.; Walker, Duncan M. (Hank) | VLSI Test |