Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2008 | Diagnosis of Multiple Scan Chain Timing Fault | Chuang, W.S.; Li, James C.-M. | IEEE Trans. Computer-aided Design of IC and Syst | |||
2006 | Logic and Fault Simulation | Huang, J.-L.; Li, James C.-M.; Walker, Duncan M. (Hank) | VLSI Test |