Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
1998 | Mean estimate for Shewhart-chart-monitored processes subject to random shifts | Chen, Argon ; Elsayed, E.A. | 1998 IEEE International Conference on Systems, Man, and Cybernetics | 0 | 0 | |
1993 | Optimal levels of process parameters for products with multiple characteristics | Elsayed, E.A.; ARGON CHEN | International Journal of Production Research |