公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2006 | Metal gate/High-K dielectric stack on Si cap/ultra-thin pure Ge epi/Si substrate | Yeo, C.C.; Lee, M.H.; Liu, C.W.; Choi, K.J.; Lee, T.W.; Cho, B.J.; CHEE-WEE LIU | 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC | |||
2006 | Thermal stability study of Si cap/ultrathin Ge/Si and strained Si/Si <inf>1-x</inf>Ge<inf>x</inf>/Si nMOSFETs with HfO<inf>2</inf> gate dielectric | Yeo, C.C.; Cho, B.J.; Lee, M.H.; Liu, C.W.; Choi, K.J.; Lee, T.W.; CHEE-WEE LIU | Semiconductor Science and Technology |