Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2013 | Sinusoidal trajectory for atomic force microscopy precision local scanning with auxiliary optical microscopy. | Chen, Chih-Lieh; Wu, Jim-Wei; Lin, Yi-Ting; Lo, Yu-Ting; LI-CHEN FU | Proceedings of the IEEE Conference on Decision and Control | 6 | 0 |