公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
1993 | Optimal levels of process parameters for products with multiple characteristics | Elsayed, E.A.; ARGON CHEN | International Journal of Production Research | | | |
2008 | Optimal sampling in design of experiment for simulation-based stochastic optimization | Brantley, M.W.; Lee, L.H.; Chen, C.-H.; ARGON CHEN | 4th IEEE Conference on Automation Science and Engineering | | | |
2007 | Optimal supply chain configurations in semiconductor manufacturing | MING-HUANG CHIANG ; RUEY-SHAN GUO ; ARGON CHEN ; Cheng, Meng-Tse; Chen, Cheng-Bang | International Journal of Production Research | 15 | 15 | |
2009 | Optimum sampling for track PEB CD integrated metrology | Chen, A.; Hsueh, S.; ARGON CHEN ; JAKEY BLUE | 2009 IEEE International Conference on Automation Science and Engineering | 2 | 0 | |
2010 | Performance analysis of demand planning approaches for aggregating, forecasting and disaggregating interrelated demands | Chen, Argon ; JAKEY BLUE | International Journal of Production Economics | | | |
2007 | Performance analysis of demand planning approaches to aggregating and forecasting interrelated demands | Chen, Argon ; Hsu, C.H.; Lan, Jakey | International Journal of Production Research | | | |
2012 | Piecewise regression model construction with sample efficient regression tree (SERT) and applications to semiconductor yield analysis | Hong, A.; ARGON CHEN | Journal of Process Control | | | |
2006 | Priority behavior modeling of fab for supply chain management | Chang, S.-C.; Liao, B.-J.; SHI-CHUNG CHANG ; ARGON CHEN | IEEE International Symposium on Semiconductor Manufacturing Conference | 0 | 0 | |
2009 | Priority cycle time behavior modeling for semiconductor fabs | Chang, S.-C.; Liao, B.-J.; Kao, Y.-T.; SHI-CHUNG CHANG ; ARGON CHEN | 1st International Conference on Advances in System Simulation | 0 | 0 | |
2007 | Product-mix estimate with dynamic weighting scheme and its application to semiconductor industry | Chen, Argon ; Yang, K.; Hsia, Z. | International Journal of Production Research | | | |
2006 | A quadratic goal programming model and sensitivity analysis for semiconductor supply chain | Chiang, D.; Guo, R.-S.; Chen, A.; ARGON CHEN ; MING-HUANG CHIANG ; RUEY-SHAN GUO | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | 0 | 0 | |
2013 | Quantitative analysis of dynamic power doppler sonograms for patients with thyroid nodules | MING-HSUN WU ; CHIUNG-NIEN CHEN ; KUEN-YUAN CHEN ; MING-CHIH HO ; HAO-CHIH TAI ; Chung, Yuan-Chang; Lo, Chan-Peng; ARGON CHEN ; KING-JEN CHANG | Ultrasound in Medicine and Biology | 22 | 22 | |
2016 | Quantitative analysis of echogenicity for patients with thyroid nodules | MING-HSUN WU ; CHIUNG-NIEN CHEN ; KUEN-YUAN CHEN ; MING-CHIH HO ; HAO-CHIH TAI ; Wang, Yu-Hsin; Chen, A.; ARGON CHEN ; KING-JEN CHANG | Scientific Reports | 32 | 32 | |
2011 | Rare-event splitting simulation for analysis of power system blackouts | Wang, S.-P.; Chen, A.; Liu, C.-W.; Chen, C.-H.; CHIH-WEN LIU ; ARGON CHEN | IEEE Power and Energy Society General Meeting | 19 | 0 | |
2003 | Rationality and Risk Analysis in Capacity Planning | Chou, Yon-Chun ; Chen, Argon | | | | |
2000 | Real-time equipment health evaluation and dynamic preventive maintenance | Chen, Argon ; Guo, R.S.; Wu, G.S. | The Ninth International Symposium on Semiconductor Manufacturing, 2000 | 0 | 0 | |
2007 | Real-time equipment health prognosis and dynamic preventive maintenance policy | Chen, Argon ; Wu, G.S. | International Journal of Production Research | | | |
1998 | A real-time equipment monitoring and fault detection system | Guo, R.S.; Chen, A.; Tseng, C.L.; Fong, I.K.; Yang, A.; Lee, C.L.; Wu, C.H.; Lin, S. ; Huang, S.J.; Lee, Y.C.; Chang, S.G.; RUEY-SHAN GUO ; ARGON CHEN | Semiconductor Manufacturing Technology Workshop | 8 | 0 | |
2007 | Real-time health prognosis and dynamic preventive maintenance policy for equipment under aging Markovian deterioration | Chen, Argon ; Wu, G.S. | International Journal of Production Research | 65 | 46 | |
2009 | Recipe-Independent Indicator for Tool Health Diagnosis and Predictive Maintenance | Chen, A.; ARGON CHEN ; JAKEY BLUE ; Chen, Argon | IEEE Transactions on Semiconductor Manufacturing | 33 | 29 | |