公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2013 | Temperature dependence of Raman scattering in bulk 4H-SiC with different carrier concentration | CHEE-WEE LIU ; Sun, H.Y.; Lien, S.-C.; Qiu, Z.R.; Wang, H.C.; Mei, T.; Liu, C.W.; Feng, Z.C.; CHEE-WEE LIU | Optics Express | | | |
2000 | Temperature dependence of the electron-hole-plasma electroluminescence from metal-oxide-silicon tunneling diodes | CHEE-WEE LIU ; MIIN-JANG CHEN ; Lin, I. C.; Lee, M. H.; CHING-FUH LIN | Applied Physics Letters | 33 | 33 | |
2002 | The band-edge light emission from the metal-oxide-silicon tunneling diode on (1 1 0) substrates | Chang, Shutong; Chen, Kuanfu; Shie, C. R.; CHEE-WEE LIU ; MIIN-JANG CHEN ; CHING-FUH LIN | Solid-State Electronics | | | |
2005 | The characteristic of HfO2 on strained SiGe | CHEE-WEE LIU ; Chen, T.C.; Lee, L.S.; Lai, W.Z.; CHEE-WEE LIU | Materials Science in Semiconductor Processing | | | |
2004 | The comparison of isolation technologies and device models on SiGe bipolar low noise amplifier | CHEE-WEE LIU ; Hua, W.-C.; Yang, T.-Y.; CHEE-WEE LIU | Applied Surface Science | | | |
2009 | The dependence of the performance of strained NMOSFETs on channel width | Yeh, L.; Liao, M.H. ; Chen, C.H.; Wu, J.; Lee, J.Y.-M.; Liu, C.W.; Lee, T.L.; CHEE-WEE LIU | IEEE Transactions on Electron Devices | 4 | 4 | |
2004 | The evolution of electroluminescence in Ge quantum-dot diodes with the fold number | Peng, Y.H.; Hsu, C.-H.; CHIEH-HSIUNG KUAN ; CHEE-WEE LIU ; Chen, P.S.; Tsai, M.-J.; Suen, Y.W. | Applied Physics Letters | 18 | 17 | |
2016 | The hysteresis-free negative capacitance field effect transistors using non-linear poly capacitance | CHEE-WEE LIU ; Fan, S.-T.; Yan, J.-Y.; Lai, D.-C.; CHEE-WEE LIU | Solid-State Electronics | | | |
2006 | The interface properties of SiO<inf>2</inf>/strained-si with carbon incorporation surface channel MOSFETs | CHEE-WEE LIU ; Lee, M.H.; Chang, S.T.; Maikap, S.; Yu, C.-Y.; CHEE-WEE LIU | Third International SiGe Technology and Device Meeting, ISTDM 2006 | | | |
2014 | The pn junctions of epitaxial germanium on silicon by solid phase doping | CHEE-WEE LIU ; Tu, W.-H.; Hsu, S.-H.; CHEE-WEE LIU | IEEE Transactions on Electron Devices | | | |
2006 | The process and optoelectronic characterization of Ge-on-insulator | Lin, C.-H.; Yu, C.-Y.; Liao, M.H. ; Huang, C.-F.; Lee, C.-J.; Lee, C.-Y.; CHEE-WEE LIU | ECS Transactions | 1 | 0 | |
2019 | Theoretical calculation of ferroelectric Hf<inf>1-x</inf>ZrxO<inf>2</inf> by first-principle molecular dynamic simulation | CHEE-WEE LIU ; Chen, P.-S.; CHEE-WEE LIU | Materials Research Express | | | |
2010 | Thermal oxide, Al<inf>2</inf>O<inf>3</inf> and amorphous-Si passivation layers on silicon | CHEE-WEE LIU ; Ho, W.S.; Chen, Y.-Y.; Cheng, T.-H.; Chen, J.-Y.; Lu, J.-A.; Huang, P.-L.; CHEE-WEE LIU | IEEE Photovoltaic Specialists Conference | | | |
2019 | Thermal SPICE Modeling of FinFET and BEOL Considering Frequency-Dependent Transient Response, 3-D Heat Flow, Boundary/Alloy Scattering, and Interfacial Thermal Resistance | CHEE-WEE LIU ; Chung, C.-C.; Lin, H.H.; Wan, W.K.; Yang, M.-T.; CHEE-WEE LIU | IEEE Transactions on Electron Devices | | | |
1999 | Thermal stability of Si/Si1-x-yGexCy/Si quantum wells grown by rapid thermal chemical vapor deposition | Liu, C.W.; Tseng, Y.D.; Chern, M.Y.; Chang, C.L.; MING-YAU CHERN ; CHEE-WEE LIU | Journal of Applied Physics | 13 | 15 | |
2006 | Thermal stability study of Si cap/ultrathin Ge/Si and strained Si/Si <inf>1-x</inf>Ge<inf>x</inf>/Si nMOSFETs with HfO<inf>2</inf> gate dielectric | CHEE-WEE LIU ; Yeo, C.C.; Cho, B.J.; Lee, M.H.; Liu, C.W.; Choi, K.J.; Lee, T.W.; CHEE-WEE LIU | Semiconductor Science and Technology | | | |
2021 | Thermally Robust Perpendicular SOT-MTJ Memory Cells with STT-Assisted Field-Free Switching | CHEE-WEE LIU | IEEE Transactions on Electron Devices | | | |
2020 | Thermoelectric transport of the half-filled lowest Landau level in a p-type Ge/SiGe heterostructure | Liu, X.; Lu, T.-M.; Harris, C.T.; Lu, F.-L.; Liu, C.-Y.; JIUN-YUN LI ; CHEE-WEE LIU ; Du, Rui-Rui | Physical Review B | 1 | 0 | |
2005 | Threading dislocation induced low frequency noise in strained-Si nMOSFETs | CHEE-WEE LIU ; Hua, W.-C.; Lee, M.H.; Chen, P.S.; Tsai, M.-J.; CHEE-WEE LIU | IEEE Electron Device Letters | | | |
2010 | Threshold voltage and mobility extraction of NBTI degradation of poly-Si thin-film transistors | CHEE-WEE LIU ; Sun, H.-C.; Huang, C.-F.; Chen, Y.-T.; Wu, T.-Y.; Liu, C.W.; Hsu, Y.-J.; Chen, J.-S.; CHEE-WEE LIU | IEEE Transactions on Electron Devices | | | |