公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
1994 | An economic design of x control chart using quadratic loss function | Elsayed, E.A.; ARGON CHEN | International Journal of Production Research | | | |
2000 | An effective SPC approach to monitoring semiconductor manufacturing processes with multiple variation sources | Chen, Argon ; Guo, R.S.; Yeh, P.J. | The Ninth International Symposium on Semiconductor Manufacturing, 2000 | 0 | 0 | |
2000 | An effective SPC approach to monitoring semiconductor quality data with multiple variation sources | Chen, Argon ; Guo, Ruey-Shan ; ARGON CHEN ; RUEY-SHAN GUO | Semiconductor Manufacturing Technology Workshop | 1 | 0 | |
2013 | Efficient simulation budget allocation with regression | Brantley, M.W.; Lee, L.H.; Chen, C.-H.; ARGON CHEN | IIE Transactions | | | |
2015 | Efficient Splitting Simulation for Blackout Analysis | Wang, S.-P.; Chen, A.; Liu, C.-W.; Chen, C.-H.; Shortle, J.; CHIH-WEN LIU ; ARGON CHEN | IEEE Transactions on Power Systems | 22 | 21 | |
2021 | Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing | Rostami H; Blue J; Chen A; ARGON CHEN ; JAKEY BLUE | International Journal of Intelligent Systems | 4 | 4 | |
2018 | Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing | Rostami, H.; Blue, J.; Chen, A.; ARGON CHEN ; JAKEY BLUE | IEEE International Conference on Automation Science and Engineering | 0 | 0 | |
1999 | Function-based cost modeling for wafer manufacturing and its application to strategic management | Guo, Ruey-Shan ; Chen, Argon; Lin, Pei-Lan; ARGON CHEN | 1999 IEEE International Symposium on Semiconductor Manufacturing Conference | 2 | 0 | |
1998 | An Integrated Approach to Semiconductor Equipment Monitoring | Chen, Argon ; Guo, Ruey-Shan ; Yang, Alex; Tseng, Chwan-Lu | Journal of The Chinese Society of Mechanical Engineering | 3 | | |
2003 | Integrated yield-mining solution with enhanced electrical test data correlation | Fan, Chih-Min; Guo, Ruey-Shan ; Chen, Argon ; Hon, Amos; Wei, John; King, Mingchu | The Ninth International Symposium on Semiconductor Manufacturing, 2003 | 0 | 0 | |
2002 | Integration of Demand Planning
and Manufacturing Planning | Chou, Yon-Chun ; Chen, Argon | | | | |
2002 | Integration of Demand Planning
and Manufacturing Planning | Chou, Yon-Chun ; Chen, Argon | | | | |
2002 | Integration of demand planning and manufacturing planning | Chou, Yon-Chun ; Chen, Argon | | | | |
2018 | Intelligent Demand Aggregation and Forecasting | Chen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy | | | | |
2003 | Intelligent Demand Aggregation and Forecasting | Chen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Cheng, Janet; Ho, Odey; Fu, Legend; Huang, Tony; Yang, Kyle | | | | |
2017 | Manufacturing Parameters Optimization in Functional Textile Dyeing Processes | Hong I.-H.; Shen Z.; Chen S.-C.; Chen A.; Tsai K.-C.; I-HSUAN HONG ; ARGON CHEN | Procedia Manufacturing | 3 | 0 | |
2021 | Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters | Shen Z; Hong A; ARGON CHEN | Advanced Engineering Informatics | | | |
1998 | Mean estimate for Shewhart-chart-monitored processes subject to random shifts | Chen, Argon ; Elsayed, E.A. | 1998 IEEE International Conference on Systems, Man, and Cybernetics | 0 | 0 | |
1999 | Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping | Guo, Ruey-Shan ; Chen, Argon; Liu, Cheewee; Lin, A.; ARGON CHEN | 1999 IEEE International Symposium on Semiconductor Manufacturing Conference | 2 | 0 | |
2020 | Multi-Reader Multi-Case Study for Performance Evaluation of High-Risk Thyroid Ultrasound with Computer-Aided Detection | MING-HSUN WU ; KUEN-YUAN CHEN ; SHYANG-RONG SHIH ; MING-CHIH HO ; HAO-CHIH TAI ; KING-JEN CHANG ; CHIUNG-NIEN CHEN ; ARGON CHEN | Cancers | 11 | 10 | |