公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2013 | Defect Analysis and Fault Modeling for Rnv8T Nonvolatile SRAM | Bing-Chuan Bai; Chen-An Chen; Yee-Wen Chen; Ming-Hsueh Wu; Kun-Lun Luo; Chun-Lung Hsu; Liang-Chia Cheng; Chien-Mo Li; CHIEN-MO LI | IEEE Int’l Test Conf. | | | |
2007 | Design and Chip Implementation of the Segment Weighted Random BIST for Low Power Testing | Chun-Yi Lee; James C.-M. Li; CHIEN-MO LI | Journal of Low Power Electronic | 0 | 0 | |
2004 | Design and Implementation of a Low Power Delay Fault Built-in Self Test Technique | L. W. Ko; C.M. Li; CHIEN-MO LI | VLSI/CAD Symposium | | | |
2014 | Detect RRAM Defects in The Early Stage During Rnv8T Nonvolatile SRAM Testing | B.C. Bai; C.A. Chen; J C.M Li; CHIEN-MO LI | IEEE International Test Conference | | | |
2010 | DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-in | W.-C. Kao; W.-S. Chuang; H.-T. Lin; J. C.-M. Li; V, Manquinho; CHIEN-MO LI | IEEE Transactions on Very Large Scale Integration (VLSI) Systems | 3 | 1 | |
2022 | Diagnosing Double Faulty Chains through Failing Bit Separation | Kuo, Cheng Sian; Hsieh, Bing Han; CHIEN-MO LI ; Nigh, Chris; Bhargava, Gaurav; Chern, Mason | Proceedings - International Test Conference | 0 | 0 | |
2018 | Diagnosis and repair of cells (DRC) responsible for power-supply-noise violations | Li, Y.-C.; Lin, S.-Y.; Lin, H.-Y.; Li, J.C.-M.; CHIEN-MO LI | 2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018 | 1 | 0 | |
2002 | Diagnosis for Sequence Dependent Chips | Li, J. C.M.; E. J. McCluskey; CHIEN-MO LI | IEEE VLSI Test Symposium | 44 | 0 | |
2008 | Diagnosis of Logic-chain Bridging Faults | Wei-Chih Liu; Wei-Lin Tsai; Hsiu-Ting Lin; James Chien-Mo Li; CHIEN-MO LI | IEEE Int’l Workshop on RTL and High Level Testing | 0 | 0 | |
2005 | Diagnosis of Multiple Hold-time and Setup-time Faults in Scan Chains | Li, J. C. M.; CHIEN-MO LI | IEEE Transactions on Computers | 30 | 31 | |
2008 | Diagnosis of Multiple Scan Chain Timing Faults | W.S. Chuang; James C.-M. Li; CHIEN-MO LI | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 8 | 8 | |
2023 | Diagnosis of Quantum Circuits in the NISQ Era | Li, Yu Min; Hsieh, Cheng Yun; Li, Yen Wei; CHIEN-MO LI | Proceedings of the IEEE VLSI Test Symposium | 0 | 0 | |
2005 | Diagnosis of Resistive and Stuck-open Defects in Digital CMOS IC | Li, J. C.-M.; E. J. McCluskey; CHIEN-MO LI | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 44 | 26 | |
2004 | Diagnosis of Scan Chains with Multiple Timing Faults Using Single Excitation Patterns | C. K. Yo; C.M. Li; CHIEN-MO LI | VLSI/CAD Symposium | | | |
2005 | Diagnosis of Single stuck-at Faults and Multiple Timing Faults in Scan Chains | Li, J. C.-M.; CHIEN-MO LI | IEEE Transactions on Very Large Scale Integration (VLSI) Systems | 40 | 38 | |
2023 | Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis | Hsieh, Bing Han; Liu, Yun Sheng; CHIEN-MO LI ; Nigh, Chris; Chern, Mason; Bhargava, Gaurav | Proceedings - International Test Conference | | | |
2005 | Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns | Li, J. C.-M.; CHIEN-MO LI | IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences | 5 | 5 | |
2001 | Diagnosis of Tunneling Opens | Li, J. C.M.; E.J. McCluskey; CHIEN-MO LI | IEEE VLSI Test Symposium | 2 | 0 | |
2020 | Diagnosis technique for Clustered Multiple Transition Delay Faults | You Y.-S; Liu C.-Y; Wu M.-T; Chen P.-W; Li J.C.-M.; CHIEN-MO LI | Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020 | 3 | 0 | |
2014 | Divide and Conquer Diagnosis for Multiple Defects | SM Chao; PJ Chen; JCM Li; CHIEN-MO LI | IEEE International Test Conference | 0 | 0 | |