公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2019 | Reduced RTN amplitude and single trap induced variation for ferroelectric FinFET by substrate doping optimization | Lin Z.-T; Hu V.P.-H.; VITA PI-HO HU | 2019 Silicon Nanoelectronics Workshop, SNW 2019 | 1 | 0 | |
2017 | Reliability-Tolerant Design for Ultra-Thin-Body GeOI 6T SRAM Cell and Sense Amplifier | V. P.-H. Hu; VITA PI-HO HU ; V. P.-H. Hu; 胡璧合 | IEEE Journal of the Electron Devices Society | 8 | 7 | |
2023 | Robust Recovery Scheme for MFIS-FeFETs at Optimal Timing with Prolonged Endurance: Fast-Unipolar Pulsing (100 ns), Nearly Zero Memory Window Loss (0.02 %), and Self-Tracking Circuit Design | Wu, C. H.; Liu, J.; Zheng, X. T.; Tseng, Y. M.; Kobayashi, M.; VITA PI-HO HU ; Su, C. J. | Technical Digest - International Electron Devices Meeting, IEDM | | | |
2021 | Sensitivity Analysis and Design of Negative-Capacitance Junctionless Transistor for High-Performance Applications | Gupta M; VITA PI-HO HU | IEEE Transactions on Electron Devices | 2 | 2 | |
2022 | Sensitivity Analysis of Ferroelectric Junctionless Transistors for Non-volatile Memory Applications | Gupta M; VITA PI-HO HU | 2022 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2022 | 1 | 0 | |
2014 | Single-trap-induced random telegraph noise for FinFET, Si/Ge Nanowire FET, Tunnel FET, SRAM and logic circuits | M.-L. Fan; S.-Y. Yang; Y.-N. Chen; P. Su; C.-T. Chuang; VITA PI-HO HU | Microelectronics Reliability | 23 | 22 | |
2019 | Split-Gate FeFET (SG-FeFET) with Dynamic Memory Window Modulation for Non-Volatile Memory and Neuromorphic Applications | Lin H.-H; Zheng Z.-A; Lin Z.-T; Lu Y.-C; Ho L.-Y; Lee Y.-W; Su C.-W; Su C.-J.; VITA PI-HO HU | Digest of Technical Papers - Symposium on VLSI Technology | 18 | 0 | |
2015 | Stability analysis for UTB GeOI 6T SRAM cells considering NBTI and PBTI | VITA PI-HO HU ; Fan M.-L; Su P; Chuang C.-T. | International Symposium on VLSI Technology, Systems, and Applications, Proceedings | 0 | 0 | |
2023 | Stability and Performance Optimization of 6T SRAM Cell at Cryogenic Temperature | Fang, Shao Fu; VITA PI-HO HU | 7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023 | 1 | 0 | |
2014 | Stability and Performance Optimization of Heterochannel Monolithic 3-D SRAM Cells Considering Interlayer Coupling | M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; P. Su; C.-T. Chuang; VITA PI-HO HU ; M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; P. Su; C.-T. Chuang; 胡璧合 | IEEE Transactions on Electron Devices | 8 | 6 | |
2021 | Static Noise Margin Analysis for Cryo-CMOS SRAM Cell | Liu C.-J.; VITA PI-HO HU | 2021 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2021 | 3 | 0 | |
2009 | Static Noise Margin of Ultrathin-Body SOI Subthreshold SRAM Cells—An Assessment Based on Analytical Solutions of Poisson's Equation | Y.-S. Wu; M.-L. Fan; P. Su; C.-T. Chuang; VITA PI-HO HU | IEEE Transactions on Electron Devices | 7 | 5 | |
2020 | Subthreshold Behavior of Ferroelectric Junctionless Transistor | Hu V.P.-H.; VITA PI-HO HU | 2020 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2020 | 0 | 0 | |
2013 | Threshold Voltage Design and Performance Assessment of Hetero-Channel SRAM Cells | V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; VITA PI-HO HU ; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合 | IEEE Transactions on Electron Devices | 7 | 6 | |
2013 | Threshold Voltage Design of UTB SOI SRAM With Improved Stability/Variability for Ultralow Voltage Near Subthreshold Operation | V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; VITA PI-HO HU ; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合 | IEEE Transactions on Nanotechnology | 7 | 5 | |
2012 | Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications | M.-L. Fan; Y.-N. Chen; P. Su; C.-T. Chuang; VITA PI-HO HU | IEEE Transactions on Circuits and Systems II: Express Briefs | 17 | 12 | |
2022 | Variation-Tolerant Recall Operation for Nonvolatile SRAM Integrated with Ferroelectric Capacitor | Li, Ai Fang; Huang, Ruei Yu; VITA PI-HO HU | 6th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2022 | 1 | 0 | |