| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2017 | Atomic-Scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control | Lin, W.-H.; Brar, V.W.; Jariwala, D.; Sherrott, M.C.; Tseng, W.-S.; Wu, C.-I.; Yeh, N.-C.; Atwater, H.A.; CHIH-I WU | Chemistry of Materials | 29 | 29 | |
| 2016 | Suppression of surface recombination in CuInSe2 (CIS) thin films via Trioctylphosphine Sulfide (TOP:S) surface passivation | Luo, S.; Eisler, C.; Wong, T.-H.; Xiao, H.; Lin, C.-E.; Wu, T.-T.; Shen, C.-H.; Shieh, J.-M.; Tsai, C.-C.; Liu, C.-W.; Atwater, H.A.; Goddard, W.A.; Lee, J.-H.; CHEE-WEE LIU et al. ; JIUN-HAW LEE | Acta Materialia | 14 | 13 |
